This instrument is designed for the study of textured or even single-crystal bulk samples, as well as textured or epitaxial thin films. The main applications are:
Textural analysis, determination of residual stresses, high-resolution measurements using both X-ray diffraction (HR-XRD) and reflectometry (HR-XRR), and in-plane diffraction (in-plane GID).
All of these analyses can be performed at elevated temperatures using a heating chamber designed for this type of goniometer.
Diffractometer Setup :
- 9 kW high-power rotating anode generator – copper Ka-band
- 5-axis goniometer + motorized Z-axis + X-Y translation stage or dual motorized cradle (Rx – Ry)
- CBO module (easy switching from Bragg-Brentano geometry to parallel configuration with Göbel mirror)
- CBO-f module for use with the Hypix-3000 detector in 2D mode
- High-resolution front optics: Channel Cut Ge (400) x 2 or Bartels Ge (220) x 4
- HR Channel Cut Ge (220) x 2 analyzer
- PSC (0.15° or 0.5°) and PSA (0.114° or 0.5°) plane collimators for in-plane GID measurements
- Detectors: point scintillator, 1D DTEX Ultra type, or 2D Hypix-3000
- Anton Paar DHS 1100 temperature chamber – from ambient to 1100°C in air or N2
