Main equipment :
SEM:
- SEM FEG ZEISS Ultra 55
- ESEM FEG FEI QUANTA 250
- Coming soon : HR SEM-FEG with EDX & EBSD systems and nanoindentation system
- 3 W SEM with EDX
- CAMECA SX50 mcroprobe (EMPA)
- EBSD
SEM-FIB :
- SEM-FIB ZEISS Cross Beam NVision 40 (CMTC& PFNC & PTA)
In Situ Mechanical Testing in SEM
- Tensile stage
- Coming soon : InSEM nanoindentation system
TEM
- TEM FEG JEOL 2100 F - 200 kV
- TEM LaB6 JEOL 2010 - 200 kV
X-ray :
- Bruker D8 Advance X-ray Diffractometer
- PANalytical X'Pert PRO MPD X-ray Diffractometer
- Rigaku SmartLab X-ray Diffractometer
- Siemens/Bruker D5000 X-ray Diffractometer
- Philips PW1730 Laue X-ray Diffractometer
Raman Spectroscopy :
- Horiba Jobin Yvon T64000 Raman spectrometer
Sample preparation:
- Grinding/Polishing Wheels
- Precision Etching Coating System (PECS)
- Advanced Plasma Cleaning (SOLARUS)