TEM JEOL 2010

Specific features of the machine CMTC-MET Jéol 2010 - Minatec

  • Canon LaB6
  • Accelerating voltage: 200 kV
  • Resolution: 0.194 nm
  • Sample holders: single-tilt, dual-tilt analytical (Be) (for EDS analysis), dual-tilt cryogenic

Operating modes

  • Conventional microscopy, high-resolution microscopy, and micro-diffraction
  • CBD: convergent beam for structural analysis
  • NBD: nano-diffraction (diffraction at the nanoscale)
  • Precession-mode diffraction
  • EDX: X-ray microanalysis

Equipements

  • GATAN Ultrascan 1000 XP CCD Camera (Model 994) 2018×2048 pixels
  • INCAEnergy TEM 100X EDS Analyzer
  • NanomégasDigistar Precession Module

Preparation of thin sections

  • Cutting (wire saw, disc saw)
  • Mechanical preparation (low-speed or normal-speed polishers, tripods, inverted microscopes)
  • Ion polishing (low-voltage GATAN PIPS)

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